ONSCALE
OnScale Computer-Aided Engineering tools are based on proprietary multiphysics solvers that were developed and validated over 30 years by one of the largest engineering consulting firms in the world for DARPA, the U.S. Department of Defense (DOD), and large commercial customers.
The CAE solvers were architected for highly parallel mainframe computers to handle very large engineering simulation problems and are a perfect fit for modern cloud-based, high-performance computing. OnScale and its new team were spun out of Thornton Tomasetti in 2017.
OnScale gives engineers a wealth of design insights and highly accurate simulation results up to 100x faster than legacy CAE offerings. Current OnScale solutions address the simulation needs of Semiconductor and MEMS, 5G mobile, next-gen biomedical, and autonomous vehicle markets.
Diagnostics & Imaging
Ultrasonic Imaging is a key technology in many aspects of the healthcare industry. Real-time, moving images are now commonplace, providing clinicians with invaluable knowledge of internal anatomy. OnScale has played a significant role in this progress having found widespread use globally with companies such as GE, Philips, Siemens, Hitachi and many more. The power of OnScale allows engineers to accelerate design cycles via the accuracy and speed of its prediction, while reducing dependency on an expensive fabrication of test devices.
Semiconductor and MEMS
OnScale provides users with a unique set of capabilities for simulating a range of MEMS Devices such as PMUTs and CMUTs and RF resonators such as SAWs, FBARs, and SMRs.
Traditionally too computationally intense for general FEA, OnScale breaks this barrier and facilitates high-level, coupled design work that was previously impossible. Easily extract key industry metrics such as Electrical Impedance, Phase Shifts, S-Parameters, Bandwidth, Resonance Modes, and much more.
With fast and efficient up-front simulation, design engineers can slash prototype fabrication costs, expedite time to market, and reduce design risk.
5G RF
OnScale provides designers of the next generation of RF filters with a unique set of simulation capabilities to greatly accelerate product development. Performance of devices such as BAWs, SAWs, FBARs and SMRs are heavily dependent on their material properties and 3D topologies, and therefore require full 3D simulation to correctly analyze.
Traditionally too computationally intense for general FEA simulations, OnScale breaks this barrier and facilitates high-level, coupled design work that was previously impossible. Easily extract key industry metrics such as Electrical Impedance, Phase Shifts, S-Parameters, Bandwidth, Resonance Modes, and much more to get Virtual Datasheets prior to tape-out.
With fast and efficient up-front simulation, design engineers can slash prototype fabrication costs, expedite time to market, and reduce design risk.
NDT
OnScale is used in a variety of NDE applications, from modeling transducers to wave-propagation and defect interaction through test-pieces. Multi-element arrays can be simulated to generate full inspection methods, e.g. FMC, or any other arbitrary arrangements. The rapid simulation times of OnScale have assisted industry in eliminating the need for fabricating expensive, bespoke test pieces for pioneering new inspection techniques.
Flow Measurement
Ultrasonic flow measurement is a growing industry which offers non-intrusive, high accuracy measurements across a range of applications. OnScale can simulate ultrasonic meter performance under the influence of complex flow fields and is used in diverse applications from anemometers to custody meters.
